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AlphaSTAR Presents AM Process Control Techniques and Microstructure Simulation at ICAM 2021

IRVINE, CALIFORNIA (10/21/2021) – AlphaSTAR will be exhibiting at the upcoming ASTM International Conference on Additive Manufacturing (ICAM), to be held at the JW Marriott in Anaheim, CA. This annual event is related to standardization, qualification, and certification with an emphasis on industry specific requirements addressing the entire AM process chain. As additive manufacturing is adopted by
various industries, AlphaSTAR is committed to disseminating its validated ICME technologies, which
are essential for accelerating the timeline of qualification and certification of AM parts in performance critical applications.

To showcase the company’s cutting-edge tools for AM process simulation, AlphaSTAR’s Director of
Technical Operations, Dr. Rashid Miraj will present on topics inclusive of Process Control & In-Situ Monitoring techniques and Microstructural Aspects in AM.

1. ‘Sensory Real-Time In-Situ Monitoring Toolset for Additive Manufactured Parts’ will take place on Tuesday, November 2nd.

This presentation focuses on the Process Control and In-Situ Monitoring Techniques in AM. It highlights recent research that AlphaSTAR conducted in collaboration with Imperial College of London on the integration of big data processing with intelligent data discovery to help minimize trial and error in AM by establishing feed forward control (FFC) and feedback control (FBC)

2. ‘Tailored Steel Microstructure with Increased Strength and Elongation by Additive Manufacturing’ will take place on Thursday, November 4th.

This presentation focuses on Microstructural Aspects in AM. The work presented was funded by the Defense Logistics Agency (DLA) in collaboration with General Electric Global Research Center (GE GRC), utilizing AlphaSTAR’s ICME developed technology to support Grain Boundary Engineering for Additive Manufacturing.

Additionally, on Monday, November 1st, Dr. Miraj will participate in a panel discussion on ‘In-Situ
Monitoring and Process Control in AM: Challenges and Opportunities’, which will include thought
leadership on challenges in process control and in-situ monitoring of AM, validation of data, integration
& modeling, qualification & certification, standardization and more.

For more information and to learn how you can benefit from GENOA 3DP, a parameter driven AM
simulation solution, be sure to stop by the AlphaSTAR booth at ICAM or visit our virtual booth online.

You can attend in person or tune in virtually to view 550+ presentations covering 26 symposia, 11
panel discussions and 8 keynote presentations by registering for the conference at

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